General approach to reliable characterization of thin metal films.
(2011)
Journal - Applied optics (United States )
Abstract :
Optical constants of thin metal films are strongly dependent on deposition conditions, growth mode, and thickness. We propose a universal characterization approach that allows reliable determination of thin metal film optical constants as functions of wavelength and thickness. We apply this approach to determination of refractive index dispersion of silver island films embedded between silica layers.© 2011 Optical Society of America
Comparison of algorithms used for optical characterization of multilayer optical coatings.
(2011)
Journal - Applied optics (United States )
Abstract :
Two algorithms used for the on-line and off-line characterization of multilayer optical coatings are experimentally compared using test samples produced by two different deposition processes and different monitoring approaches. One of these algorithms, called the triangular algorithm, demonstrates its superiority in all considered situations. We performed experiments with multilayer samples formed by high-density thin films, which allowed us to neglect possible errors in the film refractive indices and concentrate only on errors in the thicknesses of the layers of the produced coatings.© 2011 Optical Society of America
Measurement of group delay of dispersive mirrors with white-light interferometer.
(2009)
Journal - Applied optics (United States )
Abstract :
A new model for the determination of group delay (GD) and GD dispersion of dispersive mirrors is presented. The algorithm based on this model enables one to process interferometric data provided by a white-light interferometer and to obtain GD wavelength dependence over a broad spectral range.
Empirical expression for the minimum residual reflectance of normal- and oblique-incidence antireflection coatings.
(2008)
Journal - Applied optics (United States )
Abstract :
A new empirical expression for estimating minimum achievable residual reflectance of antireflection (AR) coatings is presented. The expression gives an accurate approximation of the minimum residual reflectance for normal- and oblique-incidence AR coatings in the visible and infrared spectral ranges.